Abstract
Thin CeO 2 layers were prepared by on-axis radio frequency sputtering on R-plane sapphire substrates that came from two different sources, A (A substrates) and B (B substrates). We have observed reproducible XRD rocking curves ( Δω, shape) depending on the source of substrates and their pre-annealing. AFM measurements reveal a clear difference between the surface topography of A and B, pre-annealed or non-pre-annealed substrate. CeO 2 layers deposited on pre-annealed A substrate show reproducibly two-component rocking curves, a higher concentration of holes, and increased roughness. On the other hand, CeO 2 layers grown on pre-annealed B substrate give singular rocking curves, and almost no holes in the layers were observed. YBa 2Cu 3O 7 thin films, deposited on the examined CeO 2 by two different methods––high pressure dc sputtering, pulsed laser deposition, show different zero magnetic field microwave absorption on temperature, depending on the shape of rocking curve. The results obtained clearly show that the substrate itself can generate CeO 2 layers with two-component (supercrystallinity) rocking curves.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
