Abstract

The effect of post-deposition annealing on the structural and optical properties of CuCrO2 and Mg-doped CuCrO2 thin films is reported. The prepared films were annealed in Helium atmosphere at 300 °C. X-ray diffraction analysis revealed the decreased crystallinity and Raman studies clarify the decreased copper defects at interstitials sites with annealing. The NIR wavelength transparency increases and the maximum transmission of 72% was obtained for Mg-doped annealed film of 211 nm thickness.

Full Text
Published version (Free)

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call