Abstract
The dependence of changes in the electrical conductance of continuous thin metallic double-layer films on changes in the thickness of the overlayer deposited onto the base layer was calculated. We took into consideration the influence on the electrical conductance of a double-layer film (apart from the background mechanism of the scattering of conduction electrons) of scattering at the external surfaces of the layer and at the interface. It was found that when the diffuse scattering of the conduction electrons by the layer surface system comprising the interface, the overlayer and the external surface increases in comparison with scattering at the external surface of the uncovered base film, the total conductance of the double- layer film first decreases and then increases with increasing overlayer thickness.
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