Abstract
The pinning mechanism of MOCVD-grown YBCO coated conductors with Y2O3 precipitates was investigated by angle-resolved transport measurement of Jc in a wide range of temperature and magnetic fields. Aside from the Y2O3 nanoprecipitates, a-axis grains and threading dislocation along the c-axis were found in the YBCO layer. The Y2O3 precipitates are less effective pinning centers at lower temperature. The tapes with precipitates show a higher anisotropy with larger Jc at H || ab than H || c. This behavior was attributed to the preferred alignment of the nanoprecipitates along the ab-plane.
Highlights
The second generation high-temperature superconducting wire based on YBCO (YBa2Cu3O7−δ) grown-epitaxially on metallic substrates has shown a great promise for high-current transmission applications
This is quite unexpected since previous studies have found that Y2O3 additions are isotropic pinning centers in pulsed laser deposition (PLD)-grown [2] and MOD (Metal Organic Deposition)-grown
Y2O3 nanoprecipitates were successfully introduced into the YBCO layer of metal-organic chemical vapor deposition (MOCVD) grown YBCO tapes with MOCVD-grown (Y, Ce)O1.5+x and chemical solution deposition (CSD)-LZO buffer layers on a magnetic Ni5%W substrate
Summary
The second generation high-temperature superconducting wire based on YBCO (YBa2Cu3O7−δ) grown-epitaxially on metallic substrates has shown a great promise for high-current transmission applications. One of the most common forms of random pinning center are Y2O3 precipitates which greatly enhance Jc of YBCO tapes [1, 2, 3, 4]. Some studies explored the effect of adding magnetic nanoparticles such as YFeO3 that enhanced Jc without degrading the superconducting characteristics of the films [5]. Another important aspect is the deposition process for the production of YBCO coated conductors, such as pulsed laser deposition (PLD), chemical solution deposition (CSD) and metal-organic chemical vapor deposition (MOCVD). The microstructure of the tape with YFeO3 addition was investigated by TEM using a FEI Tecnai G2 electron microscope operated at 200 kV, a Philips CM30 electron microscope operated at 300 kV and a FEI Titan electron microscope operated at 120, 200 and 300 kV
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