Abstract
The effect of a Ti underlayer on Co-Cr thin film was investigated from the crystallographic and morphological points of view. The Co-Cr film on a Ti underlayer has a larger perpendicular magnetic anisotropy and coercive force than that deposited directly on a polyimide film substrate. It is found that the improvement of perpendicular magnetic properties by the insertion of a Ti underlayer is not due to the improvement of the crystallographic c-axis orientation, but is due to the formation of a uniform columnar structure.
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