Abstract
Most theoretical treatments of single‐surface scatter indicate negligible depolarized scatter into the plane of incidence. However, experimental measurements show that this scatter component is present. Several investigators have attempted to develop an explanation for the contradiction by attributing the depolarization to multiple scatter on the surface, but there is also evidence that the depolarization arises from volume scatter beneath the surface. In the Reneau et al. [1967, p. 463] measurements of laser scatter from inhomogeneous dielectrics they found, “… strong evidence that the depolarization process occurs primarily within the volume.” In similar studies Leader [1970, p. 11] also found, “The depolarized component is many orders of magnitude less than the polarized component when there is little contribution from the volume of the sample.” This paper presents a development for backscatter from rough surfaces, based on the single‐surface Kirchhoff method as employed by Fung [1967], which incorporates components due to volume scatter from the subsurface. The resulting expression contains a depolarized backscatter component due exclusively to the volume scatter. Calculation of polarized and depolarized backscatter and depolarization ratios are shown for several values of dielectric constants and volume reflection coefficients.
Published Version
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