Abstract

The method of arriving at the characteristic temperature by measuring the fall of intensity of reflection of x rays with increasing temperature by gas-free pure palladium leads to approximately the same value (267°K) as that deduced from specificheat and electrical-conductivity measurements, i.e. 270 and 275°K respectively. The characteristic temperature of palladium containing small amounts of hydrogen increases with increasing hydrogen concentration, reaching the value 311°K for a concentration of 0.7 at.% of hydrogen. The root-mean-square displacement of the palladium atoms at room temperature decreases with increasing hydrogen content from 0.131 A for gas-free palladium to 0.113 A for a concentration of 0.7 at.% of hydrogen.

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