Abstract
The effect of surface roughness of the back-side of a film-supporting material on Fourier transform infrared (FTIR) external reflection (ER) spectra was studied by using 9-monolayer cadmium stearate Langmuir–Blodgett (LB) films. The LB films are prepared on two infrared-transparent ZnSe substrates whose top surfaces are optically polished and bottom surfaces have controlled surface roughness with 1.2 and 0.1 μm of protrusions. Although the roughness of 0.1 μm is smaller than the wave-length of the infrared ray, both LB films show typical ER spectra qualitatively. On closer inspection, however, the LB film on the substrate with 0.1 μm protrusions is irregular and the LB film on 1.2 μm protrusions is better. These results indicate that the surface roughness of the backside of substrate is necessary for ER analyses.
Published Version
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