Abstract
We have investigated the influence ofMgB2 layer thickness on the superconducting properties ofMgB2 /Ni multilayer thin films. Multilayer thin films were prepared using an alternate growth ofMgB2 (31, 22, and 15 nm inthickness) and Ni (∼1 nm) layers. The critical temperature,Tc, upper critical field,Bc2, and magneticirreversibility field, Birr,values decreased as the MgB2 layer become thinner. In the multilayer thin films, the critical current density,Jc, was higher in fields parallel to the substrate than in perpendicular fields,reflecting the layered nanostructure parallel to the substrate. On decreasing theMgB2 layer thickness, the peak position of the global pinning force,Fp, curves moved to higher magnetic field. These peak shifts could be explained bya matching effect of the flux lines with the periodic multilayer nanostructure.
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