Abstract

In this work, Ta/M/CoFeB/MgO/Ta multilayers were designed to investigate the effect of M insertion on the anomalous Hall effect (AHE) and perpendicular magnetic anisotropy (PMA). Once inserted, Bi did not remain at the interface of Ta and CoFeB; it migrated to the surface of the films, which was not beneficial to PMA. X-ray photoelectron spectroscopic analyses revealed that the segregation of Ta was partly suppressed by the insertion of an Mo, Hf or Pt layer. However, the formation of a CoPt (or FePt) alloy decreased the PMA in the case of a Pt layer. The sample with Hf and Mo still exhibited a clear PMA after annealing at a 350 and 500 °C, respectively.

Highlights

  • The anomalous Hall effect (AHE) in ferromagnetic materials has attracted extensive attention due to its controversial mechanisms[1] and potential applications in electronics devices.[2]

  • Ta/M/CoFeB/MgO/Ta multilayers were designed to investigate the effect of M insertion on the AHE and perpendicular magnetic anisotropy (PMA) in CoFeB/MgO multilayers

  • The AHE and PMA are influenced by introducing a Mo and Hf metal layer at the Ta/CoFeB interface, and, more importantly, thermally stable AHE and PMA features are obtained in multilayers, due to interface modification

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Summary

INTRODUCTION

The anomalous Hall effect (AHE) in ferromagnetic materials has attracted extensive attention due to its controversial mechanisms[1] and potential applications in electronics devices.[2]. Ferromagnetic materials with the AHE are potential candidates for practical applications in the field of magnetic sensors, memories, and logic devices.[10,11,12] With the development of spintronics, AHE has been studied in FM/NM layered structures such as Co/Au, Co/Pd, Co/Cu, and Co/Pt multilayers.[13,14,15,16] Currently, CoFeB/MgO multilayers have been used for the design of AHE-based devices,[17] while it is difficult for them to show thermally stable AHE and PMA simultaneously, due to elements interdiffusion during annealing.[18,19] it is necessary to make CoFeB/MgO multilayers exhibit thermally stable AHE and PMA features by material design for applications of AHE-based devices.

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