Abstract
The evolution of the characteristic photoluminescence (PL) of the 0.15 eV Cu acceptor level in GaAs has been studied as a function of hydrostatic pressure. In the pressure range up to 35 kbar, i.e. in the direct gap region, the Cu-related PL band closely tracks the near-band-edge emission. The pressure derivative of the Cu acceptor level has been determined and is found to be 0.3 ± 0.2 meV/kbar. This number is only a small fraction of the total pressure derivative of the Γ 1C− Γ 15V energy gap which amounts to 10.7 meV/kbar, a result similar to our previous findings for the Mn acceptor level in GaAs, for which the pressure derivative was found to be 1.2 ± 0.2 meV/kbar. It should be noted that the remaining difference in pressure derivative is significant and beyond the uncertainty of the experimental data.
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