Abstract

The evolution of the characteristic photoluminescence (PL) of the 0.15 eV Cu acceptor level in GaAs has been studied as a function of hydrostatic pressure. In the pressure range up to 35 kbar, i.e. in the direct gap region, the Cu-related PL band closely tracks the near-band-edge emission. The pressure derivative of the Cu acceptor level has been determined and is found to be 0.3 ± 0.2 meV/kbar. This number is only a small fraction of the total pressure derivative of the Γ 1C− Γ 15V energy gap which amounts to 10.7 meV/kbar, a result similar to our previous findings for the Mn acceptor level in GaAs, for which the pressure derivative was found to be 1.2 ± 0.2 meV/kbar. It should be noted that the remaining difference in pressure derivative is significant and beyond the uncertainty of the experimental data.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.