Abstract
We report our detailed studies of the microstructures of EuBa2Cu3O7−x (Eu123) films by using high-resolution x-ray diffraction. Reciprocal space maps show that the growth rate plays an important role in nucleation of a-axis Eu123 films on SrTiO3 (STO) substrates at a given deposition temperature. It is further revealed that a pseudotetragonal distortion often occurs in Eu123 films. This distortion, however, can be eliminated by decreasing the deposition rate. The low mobility of Eu atoms on the STO substrate is suggested to be the main reason for these phenomena.
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