Abstract
We report the effect of grain boundary resistance on the dielectric response of CaCu3Ti4O12 (CCTO11CCTO is the abbreviation of CaCu3Ti4O12.). The complex impedances of all of the samples were measured, and dc bias was applied to the samples to investigate the dielectric properties of CCTO. The grain boundary resistance is found to indeed affect the dielectric constant of CCTO. Although all of the samples exhibit reasonably high dielectric constants (above 104), the sample with higher grain boundary resistance exhibits a lower dielectric constant. The influence of the grain boundary resistance on the dielectric constant may originate from its effect on the electrode contact response of CCTO. Moreover, we found the ice-water quenched sample exhibits abnormal dielectric response to the external dc bias at low frequency, that is, when the dc bias increases to 15V, the dielectric constant decreases to a negative value. The possible reason for this phenomenon is discussed.
Published Version
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