Abstract
A short description of Dynamic Eclipse Mapping methodology is given. These tools are designed for mapping the surface patterns of non-radial oscillations on eclipsing binary components, using the effective surface sampling of the eclipses. I present two approaches to the problem, an image reconstruction (EM) and a direct model fitting (DF) method, review their capabilities and limitations, then report about the status of their application on real data, with emphasis on the encountered difficulties and caveats.
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