Abstract
AbstractThe powder diffraction x-ray technique commonly used to measure strain in polycrystalline materials requires a knowledge of the elastic constants in order to convert the strain into a stress value. For many materials, these constants are not always known. Another technique to measure strain is the x-ray lattice curvature (substrate bending) method which requires no knowledge of the film elastic constants. The strain is measured in the substrate and requires only the elastic constants of the substrate to convert the measured strain into stress. Using a combination of the powder diffraction technique and a double crystal lattice curvature technique, the elastic constants of TaSi2and WSi2have been determined for various crystallographic directions.
Published Version
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