Abstract
We present the results of crystallization of amorphous thin Ni-Zr alloy films. The alloys were prepared by the sputter-deposition technique over the continuous composition range Ni92.7Zr7.3 to Ni20.7Zr79.3. The samples were heated in the electron microscope incorporating the microscope heating stage and crystallization was viewed through the diffraction mode. The average grain sizes of the microstructure after cooling to room temperature were measured. It was found that there was no enhancement of the crystallization temperature, Tx, in the region of the eutectics and that the compositional dependence of crystallization temperature bore no relation to features of the equilibrium phase diagram. Comparison of Tx of thin alloys with that of sputtered 5 mu m thick alloys heated in the differential scanning calorimeter yielded inconclusive results from the temperature-thickness relationship. Results of Tx from some melt-quench alloys are also compared with our data.
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