The correlation between the radial distribution of high-energetic ions and the structural as well as electrical properties of magnetron sputtered ZnO:Al films

Abstract

The origin of the pronounced radial distributions of structural and electrical properties of magnetron sputtered ZnO:Al films has been investigated. The film properties were correlated with the radially resolved ion-distribution functions. While the positive ions exhibit low energies and a radial distribution with a maximum intensity opposite the center of the target, the negative ions can have energies up to several hundred eV, depending on the target potential, with a radial distribution with two maxima opposite the erosion tracks. The most prominent positive ion is that of the working gas (Ar+), while the highest flux of the negative ions is measured for negative oxygen O−. The radial distribution of the flux of the high-energetic negative ions can clearly be related to the radial variations of the structural (c-axis lattice parameter, crystallite size) and electronic (resistivity) properties for sputtering from the planar target, which points to the decisive role of the high-energetic negative oxygen ions for the film quality. The relation between the negative ion bombardment and the structural as well as electronic properties can be explained by a qualitative model recently developed by us. The same target has also been investigated in the eroded state. In this case, the limited acceptance angle of the mass spectrometer leads to a misinterpretation of the radial distribution of the flux of the high-energetic negative ions. This effect can be explained by a simulation, based on the assumption that the high-energetic negative ions are mainly accelerated in the cathode (target) sheath perpendicular to the uneven substrate surface.