Abstract

Oxygen defects are introduced into PbZr0.5Ti0.5O3 films and their impact on ferroelectric behavior, linear dielectric response (LDR), and nonlinear dielectric response (NDR) is studied. Apart from a notable decrease in both polarization and LDR permittivity, the frequency spectra of LDR exhibit a distinctive loss peak. The peak position varies with temperature and oxygen defect concentration. NDR parameters, including the Rayleigh coefficient (α1), the slope (α2) correlating the imaginary part of permittivity with the ac electric field, and the slope (k) between the real and the imaginary parts of permittivity, demonstrate diverse behaviors in response to temperature and oxygen defect concentration. The similarity in the frequency spectra of tanδ and 1/k reveals the correlation between LDR and NDR induced by the presence of oxygen defects. These observations are attributed to the behavior of the single and composite defects associated with oxygen vacancies.

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