Abstract
Knowledge of the interaction forces between colloidal particles and surfaces is a precondition for understanding the stability of dispersed systems and adhesion phenomena. One of the methods available for direct measurement of surface forces is the atomic force microscope (AFM). Based on this method the so called “colloidal probe technique” was developed more than 10 years ago. Using a micron-sized particle glued to the end of an AFM cantilever as the force sensor, this technique is predestined for the study of colloidal interactions. In this review we describe the colloidal probe technique and give an overview of its application in the field of adhesion forces.
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