Abstract
The ray tracing codes for flat, cylindrically bent (Johann horizontal focusing and von Hamos vertical focusing geometry), elliptically and spherically bent crystal spectrometers were developed. The codes, extended by introducing the two-dimensional source and the real shape of single crystal diffraction pattern in dependence on the radius of curvature, contribute to a proper choice of experimental configuration in x-ray plasma diagnostics. A method of ray tracing the von Hamos spectrometer is presented in detail. The use of the ray tracing code to the optimization of the spectroscopic scheme is demonstrated on the analysis of gas-puff z-pinch experiment.
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