Abstract
Thick and thin freestanding films for the sample showing the subphases, AF and SmC n * were investigated. The thick film shows optically uniaxiality due to the helix along the smectic layer normal. However, Schlieren textures emerge in the thin film where the helical pitch is less than one pitch. It indicates that the subphases observed have biaxiality. Meanwhile, the decrease of the transmission in the bright brush in Schlieren textures compared with that in the SmC* phase support the distorted Ising model.
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