Abstract
Atomic resolution imaging of the Ag(111) surface is demonstrated with the noncontact atomic force microscope (AFM) using frequency modulation (FM) detection method in an ultrahigh vacuum at room temperature, for the first time. The constant excitation mode is used to suppress the destruction of the tip apex and sample surface, in which the constant amplitude voltage is supplied to piezoelectric scanner for cantilever oscillation. Trigonal pattern can be clearly seen. Measured distance between the protrusions is 2.8±0.1 Å, which is in good agreement with the lattice spacing of Ag(111) surface. The corrugation height is estimated to be 0.1–0.2 Å. These results suggest that the noncontact AFM has potential for imaging pure metal surfaces with atomic resolution.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
