Abstract
PurposeThe aim is to focus on the application of X‐rays in the failure analysis of electronic devices and systems, with an emphasis on X‐ray radiography and X‐ray spectroscopy.Design/methodology/approachThe theory behind X‐ray radiography and X‐ray spectroscopy is reviewed, and relevant case studies are used to illustrate the application of these techniques in the failure analysis of electronic devices and systems.FindingsExamples from recent case studies are given.Originality/valueThe paper provides an introduction to X‐ray methods for engineers working on the failure analysis of electronic devices and systems who may be unfamiliar with these techniques.
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