The Application of HIWO–SVM in Analog Circuit Fault Diagnosis

Abstract

The paper proposes a fault diagnosis model based on the HIWO–SVM algorithm given the fact that the basic support vector machines (SVM) cannot solve effectively the problem of fault diagnosis in analog circuit. First of all, the wavelet package technique is adopted for extracting the information of the faults from the test points in the analog circuit. The differential evolution (DE) algorithm is then integrated with the purpose of improving the performance of the basic IWO algorithm, i.e. a hybrid IWO (HIWO) algorithm. The HIWO algorithm is further used to optimize the parameters of SVM in order to avoid the randomness of the parameter selection, thereby improving the diagnosis precision and robustness. The experimental results on a filter circuit show that the method is more effective and reliable than the other methods for fault diagnosis.