The “accumulation effect” of positrons in the stack of foils, detected by measurements of the positron implantation profile

Abstract

The profiles of positrons implanted from the radioactive source 22Na into a stack of foils and plates are the subject of our experimental and theoretical studies. The measurements were performed using the depth scanning of positron implantation profile method, and the theoretical calculations using the phenomenological multi-scattering model (MSM). Several stacks consisting of silver, gold and aluminum foils, and titanium and germanium plates were investigated. We notice that the MSM describes well the experimental profiles; however when the stack consisting of silver and gold foils, the backscattering and linear absorption coefficients differ significantly from those reported in the literature. We suggest the energy dependency of the backscattering coefficient for silver and gold. In the stacks which comprise titanium and germanium plates, there were observed the features, which indicate the presence of the “accumulation effect” in the experimental implantation profile. This effect was previously detected in implantation profiles in Monte Carlo simulations using the GEANT4 tool kit, and it consists in higher localization of positrons close the interface. We suppose that this effect can be essential for positron annihilation in any heterogeneous materials.