Abstract

LED driver is the key component of LED lighting system, the damage of the driver will cause the failure of the whole lamp, but there is no specific test method for accelerated life test of LED driver at the system level. In order to study the acceleration effect of different stress conditions, research on the principle of LED driver, select different stress application conditions according to different electrical topology. In order to ensure that the stress does not affect the normal operation of the driver, and the failure mode or failure mechanism will not be changed, it is necessary to carry out the limit stress test before designing the test scheme. The results show that the acceleration effect is significant under the condition of constant temperature humidity or constant temperature humidity voltage compound stress, moreover, the acceleration effect is not obvious under the condition of single constant temperature or constant humidity temperature cyclic stress. The accelerated life model of LED driver is established, and the linear fitting is carried out by Weibull distribution and least square method, the variable parameters in the model are derived from the experimental data, and the accelerated life test method will be further studied.

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