Abstract
PbZr 0.3 Ti 0.7 O 3 (PZT) films were produced by polymeric precursor route and deposited by spin-coater technique on Pt(111)/Ti/SiO 2 /Si(100) substrates. The films were heat-treated using different furnaces: (a) a conventional furnace, at 700°C; and (b) a domestic microwave oven, at 600°C. The X-ray patterns revealed that both films are single phase and reflections were identified as belongs to the PZT phase. The intensity of these reflections showed a (111), (001) and (100) preferred orientation. Morphological and electrical characterizations showed that all samples present a rather different microstructure and both with high spontaneous polarization.
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