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Abstract
Crystallographic textures in a CoCrPtTa/Cr/NiAl multilayer magnetic recording media were studied by electron diffraction. It was found that texture quality evolves through the thickness of the films. A large improvement of texture quality was discovered at the interface of the Cr and NiAl layers. Surprisingly, there remains a portion of randomly oriented grains in the CoCrPtTa layer, in addition to the anticipated grains of [101̄0] texture. The texture quality of the CoCrPtTa layer remains similar to that of the underlying Cr layer.
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