Abstract
The effect of amorphous carbon underlayer thickness on the microstructure of the Co/Pd multilayer perpendicular magnetic recording media was investigated. From the magnetic force microscopy observation in the AC-demagnetized state of the Co/Pd multilayer media, the magnetic cluster size was observed to effectively decrease with an increase in carbon underlayer thickness, where the higher coercivity and the higher S/ N ratio of the Co/Pd multilayer media were obtained with the thicker underlayer. Furthermore, the distribution of [1 1 1] orientation of FCC-Pd became broader, and the grain size decreased with an increase in the carbon underlayer thickness. These effects caused the magnetic exchange decoupling of Co/Pd multilayer media. We suggested that the change of microstructure was directly related to the surface roughness of the amorphous carbon underlayer.
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