Testability demonstration method of electronic equipment based on hypergeometric distribution

Abstract

Fault detection rate (FDR) and fault isolation rate (FIR) were used for electronic equipment testability demonstration usually, but they were not fit for the current electronic test equipment characteristic. So the demonstration indexes, fault detection coverage (FDC) and fault isolation coverage (FIC) were put forward in this paper. Hypergeometric distribution was instead of binomial distribution to show detecting success ratio. Then maximum likelihood estimate was application in point estimation. Bayes? formula was used for interval estimation. And testability demonstration rule was put forward. At last, an example was given to approve the validity and practicability of the new method.