Study on Hypergeometric Distribution Method of Electronic Equipment Testability Demonstration

Abstract

Fault detection rate (FDR) and fault isolation rate (FIR) were used as testability demonstration indexes for electronic test equipment usually, but they were not very fit for current electronic test equipments any longer. So the new demonstration indexes, Fault detection coverage (FDC) and fault isolation coverage (FIC) were put forward in this paper. Hypergeometric distribution was instead of Binomial distribution to found equations and find out the sample plan. Then the usage of the Hypergeometric distribution method was expanded to demonstrate the primary test index (FDR, FIR). At last, an example was given to approve the validity and practicability of the Hypergeometric distribution method.