Test results on the silicon pixel detector for the TTF-FEL beam trajectory monitor

Abstract

Test measurements on the silicon pixel detector for the beam trajectory monitor at the free-electron laser of the TESLA test facility are presented. To determine the electronic noise of the detector and the read-out electronics and to calibrate the signal amplitude of different pixels, the 6 keV photons of the manganese K α/K β line are used. Two different methods determine the spatial accuracy of the detector: in one setup a laser beam is focused to a straight line and moves across the pixel structure. In the other, the detector is scanned using a low-intensity electron beam of an electron microscope. Both methods show that the symmetry axis of the detector defines a straight line within 0.4 μm . The sensitivity of the detector to low-energy X-rays is measured using a vacuum ultraviolet beam at the synchrotron light source HASYLAB. Additionally, the electron microscope is used to study the radiation hardness of the detector.