Test point selection methods for the self-testing based analogue fault diagnosis system

Abstract

Two methods for selecting test points of an analogue circuit are presented. The purpose of making such a selection is to increase the testability of the self-testing algorithm which is used to allocate the defective components of a given analogue circuit. Some closed relations between network equations and network topology have been investigated so that the computational effort can be reduced to minimum. This comes up with the first test point selection method. The second method for selecting a proper set of test points for fault diagnosis is a table look-up approach by which no complex matrix computation is required. Instead, only a few searches, which are based on a simple rule, on a binary matrix are needed. The cost of applying this table look-up method is that the testability of the target circuit due to the selected test points may not be the highest. Both methods are applicable to linear and nonlinear circuits.