Test Point Selection Method for Hierarchical Fault Diagnosis

Abstract

To solve the test point selection problem in hierarchical fault diagnosis of electronic equipment, corresponding optimization approaches are recommended for different diagnostic levels. The system fault diagnosis problem is divided into module-level and component-level in this paper. For module-level fault diagnosis, optimal test point set is obtained through simplifying the correlation model of test points and faults. And for component-level fault diagnosis, the fault isolation matrix of test points is firstly established, and then a heuristic optimization method is applied to search the optimal test point set. In the last part of this paper, experiment on some practical electronic equipment is conducted to demonstrate the feasibility of the proposed approaches.