Test Method of Secure and Controllable FPGA Chip Used in Flexible DC Transmission Control and Protection System

Abstract

Flexible DC transmission control and protection system is a high-performance distributed computing system, which has the characteristics of high-speed data acquisition and fast processing, and uses a large number of high-performance FPGA (Field Programmable Logic Array) chips. FPGA has the characteristics of high integration and complex manufacturing process, and its security and controllability is faced with many challenges. The reliability of FPGA is an important standard to measure its performance, so reliability test fault screening is very important to ensure its normal operation. Although the automatic test equipment (ATE) can test the fault of FPGA, it is not convenient for field testing due to the price, test environment and other factors. In this paper, a design scheme of built-in self-test (BIST) for fault detection and fault diagnosis is proposed, which can detect faults of look-up table (LUT) and interconnection resources (wires and programmable switches). At the same time, considering the effect of rising temperature on fault probability, a controlled self-heating element (SHE) is constructed by using the internal resources of FPGA to provide the required temperature for BIST testing. Finally, an integrated layout scheme of BIST and SHE is proposed. An experiment of self-heating of FPGA chip is completed by TSINGHUA PGL22G, which verifies the correctness and feasibility of the theory.