Abstract
We present the world's first test compression technique that features automation of compression rules for test time reduction on dynamically reconfigurable processors. Evaluations on an actual 40-nm product show that our technique achieves a 2.7 times compression ratio for original configuration information (better than does GZIP), the peak decompression bandwidth of 1.6 GB/s, and 2.7 times shorter test times.
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Schedule a callMore From: ACM Transactions on Reconfigurable Technology and Systems
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