Test algorithms for double-buffered random access and pointer-addressed memories

J Van Sas,H.J De Man,F Catthoor

doi:10.1109/54.211526

Test algorithms for double-buffered random access and pointer-addressed memories

J Van Sas, H.J De Man + Show 1 more

https://doi.org/10.1109/54.211526

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Journal: IEEE design & test	Publication Date: Jun 1, 1993
Citations: 8

Affiliation: IMEC, KU Leuven

#Algorithms For Memories #Test Algorithms + Show 8 more

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Abstract

Test algorithms for static double-buffered RAMs and pointer-addressed memories (PAMs) are presented. The reasons why test algorithms for single-buffered memories are inadequate to test double-buffered memories (DBMs) are discussed. To obtain a realistic fault model, the authors perform an inductive fault analysis on the DBM cells. They also show that the address generation method imposes different requirements on the test algorithms.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>

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