Abstract
The multiwalled carbon nanotubes has a myriad of applications due to its unique electrical and mechanical properties. The biomedical application of multiwalled carbon nanotubes that have been reported include drug delivery, medical imaging, gene delivery, tissue regeneration, and diagnostics. Proper characterization is required to enhance the potential application of the multiwalled carbon nanotubes. Terahertz technology is a relatively unfamiliar spectrometric technique that show promise in efficiently characterizing multiwalled carbon nanotubes. In this paper, terahertz imaging was used to characterize multiwalled carbon nanotube in comparison with other characterization techniques, including transmission electron microscopy and field emission scanning electron microscopy. The average diameter of the carbon nanotubes from the reconstructed terahertz images was 48.54 nm, while the average length of a fiber was found to be approximately 1.2 μm. The multiwalled carbon nanotubes were additionally characterized by FTIR, Raman spectroscopy, and Energy-dispersive X-ray spectroscopy.
Highlights
Carbon nanotubes are a hollow, cylindrically-shaped, nanostructured allotrope of carbon
To confirm the authenticity of the MWCNTs, the nanomaterial was analyzed with Field Emission Scanning Electron Microscopy, Energy-dispersive X-ray spectroscopy, Fourier Transform Infrared, Raman, and UVvisible Spectroscopy
The diameter and the length of the carbon nanotubes were determined through terahertz reconstructive imaging
Summary
Carbon nanotubes are a hollow, cylindrically-shaped, nanostructured allotrope of carbon. In this paper, terahertz is used to characterize multiwalled carbon nanotubes through terahertz This study is the first of its kind to shed light on the characterization of multiwalled carbon nanotubes using terahertz reconstructive imaging. The morphology and elemental composition of the multiwalled carbon nanotubes was analyzed using field emission scanning electron microscopy equipped with an energy-dispersive X-ray spectroscopy analyzer (Model FESEM: JSM-7100FA JEOL USA, Inc.).
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