Abstract
We investigated the terahertz (THz) radiation mechanism of the layered tin sulfide (SnS2) crystal via THz emission spectroscopy. Under non-resonant excitation, THz generation from SnS2 is mainly due to the optical rectification effect, which is verified by the azimuthal angle, polarization angle, and pump fluence dependence of the THz signals. Further incident angle dependent THz signals suggest that the optical progress happened at the surface of SnS2 with both in-plane and out-of-plane photon-induced dipoles. This work puts forward THz emission spectroscopy as a noninvasive characterization tool for the in-plane and out-of-plane photon-induced dipoles in layered materials.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
