Abstract
We report on the dielectric properties of non-polar a-plane (11-20) GaN (a-GaN) films in the terahertz (THz) frequency region, using THz time domain spectroscopy. We measured the transmitted THz time-domain waveforms by rotating the phi angle for 6μm-thick a-GaN films, which were lifted off from sapphire substrates. THz transmittance of a-GaN films clearly showed the angular dependence on azimuth angle, possibly due to the birefringence and optical phonon modes in a-GaN crystal. It is believed that the discrepancy in the refractive index results from the difference of the transverse-optical and the longitudinal optical phonon branches.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
