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https://doi.org/10.1063/1.3294650
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Cite Journal: Journal of Applied Physics |  Publication Date: Feb 1, 2010 |
 Citations: 13 |
Using terahertz time-domain spectroscopy, we measured the frequency dependent complex dielectric response and conductivity of n-type single-crystal ZnO epilayers with different carrier concentrations over the frequency range from 0.1 to 3.0 THz. The measured complex dielectric response and conductivity are analyzed using Drude model.
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