Abstract
In a tens-of-nanometer-scale dynamic displacement measurement system based on a fiber interferometer using high-frequency phase modulation for the reference light, we introduce active change of operation point for the phase modulator. It is experimentally demonstrated that dynamic displacement measurement is possible independent of the initial operation point.
Full Text
Published Version
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call