Abstract
Temperature-resolved small-angle X-ray scattering (SAXS) on poly(hexamethylene terephthalate) (PHT) samples crystallized from the melt yields direct information about the morphological changes in lamellar crystals and interlamellar amorphous layers upon melt-crystallization and subsequent heating to melting. Absolute intensities of these SAXS patterns were further analyzed via one-dimensional correlation and interface distribution functions. These analyses indicate that melt-crystallization at low temperature produces lamellar crystals having diverse thicknesses whereas crystallization at high temperature tends to favor growth of thick lamellar crystals with a nearly uniform distribution of thickness. When heating the PHT samples in the melting temperature region, the melting of the lamellar crystals was found to correlate well with the sequential-melting features. When these crystals are heated to higher temperatures, structural alterations from stacked lamellae to isolated lamellar crystals evolve with increasing extent of sequential melting, but, upon re-crystallization during extended annealing, the isolated lamellar crystals can pass through a reversible transition back to stacked lamellae.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
