Abstract
In this paper, we present results of morphological studies during long time melt crystallization and subsequent melting in poly(aryl ether ether ketone) (PEEK). Morphological changes were monitored via small angle X-ray scattering (SAXS). SAXS data were analyzed via a combination of the correlation and interface distribution functions. Our analysis indicates the following: (1) The semicrystalline morphology is best described by a three-phase, dual lamellar stack model. Stacks of a finite number of lamellae and interlamellar amorphous layers are separated from each other by interstack regions of amorphous material (liquid pockets). (2) Secondary crystallization occurs via the formation of secondary lamellar stacks within the liquid pockets. Secondary lamellae are thinner than primary lamellae (70 A vs 120 A), and the amorphous layer thicknesses are about 47 A in both stacks. (3) The low endotherm observed during a heating scan is associated with the melting of the secondary lamellae. (4) At room temperatu...
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.