Abstract
Temperature variations have been found to occur during the metal-organic vapour phase epitaxy (MOVPE) growth of Cd x Hg 1 - x Te (CMT) using the interdiffused multilayer process (IMP). A temperature rise was observed during the CdTe growth cycle which then decayed during the HgTe cycle. Investigation into the causes of this effect indicated it was not due to flow switching during the cycle, but was dependent on the concentrations of the two alkyls. The implications of this are discussed particularly with respect to the possible use of temperature monitoring in a diagnostic capacity.
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