Abstract
A series expansion and an approximation have been derived for the temperature in the general case of transient heat conduction in two thin layers between two semi-infinite media at different uniform initial temperatures. The temperature accuracy and thermal effusivity measurement accuracy have been mapped to establish a window of operation for direct thermal effusivity measurement by the modified transient plane source (MTPS) method. The presented temperature series enables quick thermal analysis of thermally thick and semithick samples without factory correction/calibration.
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