Abstract
Recently, thanks to the miniaturization and high performance of commercial-off-the-shelf (COTS) computer systems, small satellites get popular. However, due to the very expensive launching cost, it is critical to reduce the physical size and weight of the satellite systems such as cube satellites (CubeSats), making it infeasible to install high capacity batteries or solar panels. Thus, the low-power design is one of the most critical issues in the design of such systems. In addition, as satellites make a periodic revolution around the Earth in a vacuum, their operating temperature varies greatly. For instance, in a low earth orbit (LEO) CubeSats, the temperatures vary from 30 to −30 degrees Celsius, resulting in a big thermal cycle (TC) in the electronic parts that is known to be one of the most critical reliability threats. Moreover, such LEO CubeSats are not fully protected by active thermal control and thermal insulation due to the cost, volume, and weight problems. In this paper, we propose to utilize temperature sensors to maximize the lifetime reliability of the LEO satellite systems via multi-core mapping and dynamic voltage and frequency scaling (DVFS) under power constraint. As conventional reliability enhancement techniques primarily focus on reducing the temperature, it may cause enlarged TCs, making them even less reliable. On the contrary, we try to maintain the TC optimal in terms of reliability with respect to the given power constraint. Experimental evaluation shows that the proposed technique improves the expected lifetime of the satellite embedded systems by up to 8.03 times in the simulation of Nvidia’s Jetson TK1.
Highlights
The last decade has witnessed dramatic growth of space industry; From 2010 to 2015, the nano/microsatellite market has grown at an annual average of 39%, and it is expected that, from 2016 to 2022, it will further grow at an annual growth of 13% [1]
We presented a lifetime enhancement technique in multi-core satellite embedded systems using virtual tasks and dynamic voltage and frequency scaling (DVFS) under power constraints
In low earth orbit (LEO) CubeSats, the temperature changes greatly and a large thermal cycle (TC) occurs in the electronic parts, which is a well-known lifetime reliability threat
Summary
The last decade has witnessed dramatic growth of space industry; From 2010 to 2015, the nano/microsatellite market has grown at an annual average of 39%, and it is expected that, from 2016 to 2022, it will further grow at an annual growth of 13% [1]. The demand for small satellites has increased significantly as the space industry has shifted from the government to the private market. In keeping with such an increasing need for small satellites or space missions, the CubeSat standard was initiated [2] for small satellites that weigh about a few kilograms (In the standard, 1 unit is a 10 cm cube (10 × 10 × 10 cm3 ) with a mass of no more than 1.33 kg. A satellite may consist of a single (1U) or multiple cubes (3U, 6U, 12U and 27U).). While the CubeSats were originally developed for educational or demonstration purposes, their usages have been extended to more general and advanced missions, including scientific applications, deep space exploration, and so forth [3].
Sign-in/Register to view highlights & summary Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
