Abstract
A high energy photoelectron diffraction (XPD) study of Si(001) at different temperatures reveals that at about 1400 K a surface phase transition occurs. It has been identified as being an incomplete melting transition. The thickness of the liquid film is estimated to be about 2 Å (or two atomic layers) on the basis of single-scattering cluster calculations.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have