Abstract
Nanocrystalline gold films were made by advanced gas deposition. The mean crystallite diameter lay between ∼10 and ∼80 nm depending on substrate temperature during deposition and annealing post-treatment, as found by x-ray diffractometry and transmission electron microscopy. Temperature dependent resistivity ρ was measured in the 4<T<300 K range. The log ρ versus log T relationship displayed a discontinuity at a temperature Tcr lying between 10 and 7.2 K depending on crystallite size. This can be understood as a result of ρ being dominated by electron scattering against phonons and grain boundaries above and below Tcr, respectively.
Published Version
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