Abstract
Abstract The piezoelectric properties of polyvinylidenfluoride PVDF and vinylidenfluoride-trifluoroethylene copolymer films were measured with the Scanning Nearfield Acoustic Microscope SNAM, a non-touching profilometer. This technique enables us to investigate the topography and the local piezoactivity of the polymer films. The piezoelectric constant was determined by monitoring the surface motion stimulated by a low frequency electric field. The piezoactivity as well as the surface structure of the polymer film show a strong temperature dependence.
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